The Metrology lab contains 3 instruments that are available on a fee/hour basis for users at UW-Madison, other non-profits, and for-profit users.
Industrial micro-CT System
- Manufacturer: Zeiss Industrial Metrology
- Model: Metrotom 800
- Serial Number: 152806
- Year: 2010
- Retail Price: $465,000
- The acquisition of this equipment was made possible through a gift from Bob and Debbie Cervenka.
- Contact: Paula Hohoff hohoff@wisc.edu
- Last calibration: 22 December 2020
- Metrotom 800 Manual
- METROTOM_800_V_5_0 technical and install instructions
- WI State Registration Metrotom 800
- Metrotom 800 operating system manual
- See rate info on Fee Structure page
- The ZEISS METROTOM 800 is an industrial micro-CT scanner ideal for measuring and inspecting complete components made of plastic or light metal. With its voxel resolution down to 6 µm it is suitable for polymer and ceramic samples including fiber-reinforced polymer samples up to an area of 150 mm x 170 mm.
3D Optical Metrology System
- Manufacturer: bruker Alicona
- Model: InfiniteFocus G4
- Serial Number: 016006709908
- Year: 2011
- Retail Price: $200,000
- The acquisition of this equipment was made possible through a gift from Bob and Debbie Cervenka.
- Contact: Frank Pfefferkorn frank.pfefferkorn@wisc.edu
- Last calibrated on: 10 August 2023 (calibration certificate)
- Alicona / InfiniteFocus G4 Manual
- See rate info on Fee Structure page
Coordinate Measuring Machine (CMM)
- Manufacturer: Zeiss Industrial Metrology
- Model: Contura G2
- Serial Number: 201011502562
- Year: 2010 (refurbished 2012)
- Retail Price: $114,000
- The acquisition of this equipment was made possible through a gift from Bob and Debbie Cervenka.
- Contact: Michael DeCicco mdecicco@wisc.edu
- Last calibration: 2012
- Zeiss_CONTURA_G2 Manual
- See rate info on Fee Structure page
- The Zeiss Contura G2 CMM is used for tactile coordinate metrology. It is capable of measuring dimensions of size and location as well as verifying GD&T requirements such as flatness, runout, concentricity, etc. It has a measurable range of 700x700x600 mm. It is capable of length measurements to within 1.7 micron (error = 1.7 + L/350 micron, where L is the length measurement in mm). It is fitted with an articulating stylus meaning the probe can pivot to measure features at any angle. The CMM is compatible with probes as small as 0.3 mm in diameter for measuring very small internal features.
